Laser and Spectroscopy

The Thermo Nicolet iS50 Fourier transform infrared spectrophotometer is equipped to measure transmission, specular and diffuse reflection, diffuse transmission, and attenuated total reflection (ATR) in the mid-IR. Ranges vary for different accessories within 400 cm^-1 to 7800 cm^-1.

TDTR is a modality of femtosecond pump/probe spectroscopy. It is used to observe optically-induced changes in optical properties on a 100’s of fs time-scale.

The Keyence VK-X1000 employs a 405 nm laser to map and measure the surface of samples through confocal scanning or widefield focus variation.

This ABB solar simulator provides uniform illumination over an area of 2” x 2” at an output of 1 SUN.

The Zeiss LSM 7 Live confocal line-scanning microscope is a fast imaging system capable of 120 frames per second at 512 x 512 pixels, which enable analyzing high-speed processes with a time resolution of a few microseconds.

Measures I-V curves under solar spectrum or monochromatic illumination.

The OL 750 is a spectroradiometric measurement system for internal and external quantum efficiencies (IQE, EQE). It is equipped with a white light bias accessory that allows solar cells active area to be brought up to a typical operating energy level while measuring the spectral response simultaneously.

Measures photo-fluorescence of liquid samples. Excitation ranges from 200 nm to 800 nm. Emission between 200 nm and 900 nm. Samples can be heated or cooled from – 20°C to 100°C.

Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolution

Fast high-resolution confocal Raman/PL microscopy with excitation at 532 nm and 785 nm.

Conventional widefield inverted materials microscope equipped with C-DIC, TIC, polarization, brightfield, and darkfield in reflected or transmitted illumination.

The Cary spectrophotometers are able to do measurements of transmission and reflection in the UV, visible, and near-IR (190 nm to 3300 nm). Modes of measurement include transmission, absolute specular reflection, integrated total fluorescence, diffuse transmission (190 nm to 2500 nm), diffuse reflection, and combined diffuse reflection and transmission (190 nm to 2500 nm).

TDTR is a modality of femtosecond pump/probe spectroscopy. It is used to observe optically-induced changes in optical properties on a 100’s of fs time-scale. Primarily applied to study thermal properties of thin films and across interfaces, our two custom-built instruments, have accessories to allow for time-resolved magneto-optical Kerr-effect measurements. These instruments are based on Spectra-Physics Tsunami ultrafast Ti:sapphire lasers.

Enables time-resolved measurements of luminescent emission spectra upon photoexcitation (fluorescence and phosphorescence) to determine the lifetime of emitting states with single photon sensitivity and < 1 ns temporal resolution. Several excitation wavelengths are available in the range from 380 nm to 900 nm.

This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-1720633.

The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer.

The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm^-1.

Measures luminescent emission spectra upon photoexcitation (fluorescence and phosphorescence) and Raman scattering. Our custom-built experimental setup has discreet excitation wavelengths available, in the range from 266 nm to 1050 nm. It allows for measurements from 4.2 K to 300 K using a liquid He bath cryostat.

The Ramé-Hart Model 250 Contact Angle Goniometer / Tensiometer is equipped with a wide range of method-based interfacial analysis tools for working with pendant, inverted pendant, sessile, and captive bubble drops to obtain contact angle, surface energy, and surface and interfacial tension.

For spectroscopic ellipsometry. - Measure optical constants and thickness of multilayers or bulk materials, as well as reflectance and transmission as a function of angle of incidence, polarization, and wavelength. - Wavelength range: 240 nm to 1700 nm; - Angle of incidence: 12° to 90°; Temperature: 10 K to 700 K

For single wavelength, multiple angle ellipsometry.