Transmission and Scanning Transmission Electron Microscopy (TEM/STEM)
Determine the microstructure of materials such as grain size, defect density and type, and dislocation distribution; study the local microstructure including heterointerface and individual nanostructures; examine crystalline and amorphous structures; determine the composition of materials from micrometer level down to atomic level. Six instruments with complementary capabilities include atomic resolution (0.19 nm) TEM and analytical scanning TEM with 0.2 nm beam for atomic number (Z-contrast) imaging, EDS, EELS and nanodiffraction. Traditional sample preparation such as ion millers, Cryo TEM with cryomicrotomy, vitreous ice sample preparation and cryo-transfer are also available.
Comparison of TEM systems available in the MRL shared research facilities:
|
JEOL 1400 TEM |
JEOL 2010 TEM |
JEOL 2100 TEM |
Hitachi H9500 DETEM |
ThermoFisher Glacios cryo-TEM |
ThermoFisher Talos F200X G2 S/TEM |
ThermoFisher Themis Z S/TEM |
Electron source |
LaB6 |
LaB6 |
LaB6 |
LaB6 |
Schottky X-FEG |
Schottky X-FEG |
Schottky X-FEG |
Electron acceleration |
40-120 kV |
80, 100, 120, 200 kV |
80, 100, 120, 200 kV |
100, 200, 300 kV |
200 kV |
80, 100, 200 kV |
60, 80, 200, 300 kV, electron energy monochromator |
Resolution |
0.38 nm (point), 0.2 nm (lattice imaging) |
0.194 nm (point), 0.14 nm lattice |
0.27 nm (point), 0.14 nm lattice. |
0.18 nm (point), 0.10 nm (lattice) |
Information limit 0.23 nm |
0.10 nm (TEM line), 0.16 nm STEM |
STEM: from <60pm at 300kV to <120pm at 60 kV |
Cameras and detectors |
AMT Nanosprint (4096 x 3008, 6.8 mm pixel, CMOS). |
Gatan Orius SC1000 CCD (4008 x 2672, 9 mm pixel CCD). |
Gatan UltraScan (2048 x 2048, 14 mm pixel CCD). |
- Gatan K2 IS direct electron detector (3840 x 3712, 5 mm pixel CMOS). |
- Ceta D (4,096 x 4,096, 14 μm pixel CMOS. |
- Ceta 16M (4096 x 4096, 14 mm pixel CMOS) with speed enhancement. |
- Ceta 16M (4096 x 4096, 14 mm pixel CMOS). - HAADF, FEI-triple BF/DF detector, Gatan BF/DF detector. |
Stage and Holders |
- High tilt stage. |
-Single tilt and double tilt holders. - PI 95 PicoIndenter. |
-Single tilt (high tilt) and double tilt holders. |
- Single and double tilt holders. |
Computerized 4-axes specimen stage tilt (+/- 70o alpha tilt). |
-Piezo-enhanced CompuStage X, Y. -Single tilt and high visibility double tilt holders. -Tomography holder. -Protochips Liquid cell electrochemistry holder.
|
-Piezo-enhanced CompuStage X, Y, Z. - Single tilt holder, standard double tilt, and high visibility double tilt holders. - Tomography holder. - Hummingbird Air-free transfer holder, - Protochips MEMS heating holder |
Additional features |
-Large field of view. |
|
Large pole piece gap |
- Dynamical environmental reactions.
|
-Cryo-EM. |
-Lorents lens. -TEM Scripting. |
-5th order probe aberration correction. -Constant power lenses. - Free Lens Control - TEM Scripting |
Analytical |
|
|
|
Gatan GIF Quantum ER EELS energy resolution 2.0 eV |
|
Super-X SDD EDS (136 eV resolution) |
- Super-X SDD EDS (136 eV resolution). |
TEM/STEM Equipment
Equipment Name | Contact | Location | |
---|---|---|---|
Equipment Name | Contact | Location | |
ThermoFisher Glacios Cryo-TEM |
|
0026 Supercon |
The ThermoFisher Glacios is a high-end, 200kV X-FEG cryogenic transmission electron microscope (CryoTEM) optimized for Single Particle Analysis (SPA), electron tomography, and micro-electron diffraction (microED). The Glacios is equipped with industry-leading Autoloader grid manipulation technology controlled by the ThermoFisher EPU software, allowing users to assess sample quality in a contamination-free environment. The microscope is also equipped with a Volta Phase Plate and Falcon4 Direct Electron Detector, making the Glacios both a stand-alone system for high-resolution SPA data acquisition, and a tool for pre-optimization of sample quality before transfer to a Krios CryoTEM system. |
FEI Themis Z Advanced Probe Aberration Corrected Analytical TEM/STEM |
|
B66 MRL |
The FEI Themis Z is and advanced analytical scanning/transmission electron microscope (STEM/TEM) from Thermo Fisher Scientific Company that operates between the electron energy of 60 to 300 keV with a Schottky electron emitter, an electron energy monochromator, and a 5th order probe spherical aberration corrector. |
ThermoFisher Scientific Talos F200X G2 Scanning Transmission Electron Microscope (S/TEM) |
|
B70C MRL |
The Talos F200X G2 is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM) that combines outstanding quality in high-resolution STEM and TEM imaging with high throughput EDS signal detection and 3D chemical characterization with compositional mapping. It is designed for fast, precise and quantitative characterization of nano-materials. It accelerates nano-analysis of materials based on higher data quality, faster acquisition, and simplified and automated operation. The system’s Constant-Power™ X-TWIN lens delivers outstanding optical performance to help ensure an optimal balance of contrast and resolution. |
JEOL 2010 LAB6 TEM |
|
0017 Supercon |
The 2010LaB6 is a conventional TEM. It is optimized for BF/DF imaging, diffraction and high sample tilts. |
JEOL 2100 TEM |
|
0011 Supercon |
The JEOL 2100 is a conventional TEM with large pole piece gap. It is optimized for BF/DF imaging, diffraction and high sample tilts. Also capable of imaging ultrathin biological tissue sections. It operates at 200kV. The 2100 is equipped with a combined video rate/slow scan camera for real time imaging and final image recording. It has a low-dose mode. A high tilt is available with +/-70 degrees using a special tip for the single tilt holder. Cryo transfer stage, double tilt heating, and liquid N2 stages are available. |
Hitachi H-9500 Dynamic Environmental TEM |
|
B62A MRL |
The H-9500 is a high resolution 100-300 kV ETEM with a LaB6 electron gun equipped for study of dynamic material reactions down to the atomic scale. |
JEOL JEM-1400 TEM |
|
0021 Supercon |
The JEM-1400 uses a LaB6 filament electron gun with acceleration up to 120 kV and is also capable of lowering it down to 40 kV if required (in order to minimize sample radiation where necessary). The tool is capable of a point-to-point resolution down to 0.38 nm and lattice imaging down to 0.2 nm. |