Transmission and Scanning Transmission Electron Microscopy (TEM/STEM)

Determine the microstructure of materials such as grain size, defect density and type, and dislocation distribution; study the local microstructure including heterointerface and individual nanostructures; examine crystalline and amorphous structures; determine the composition of materials from micrometer level down to atomic level. Six instruments with complementary capabilities include atomic resolution (0.19 nm) TEM and analytical scanning TEM with 0.2 nm beam for atomic number (Z-contrast) imaging, EDS, EELS and nanodiffraction. Traditional sample preparation such as ion millers, Cryo TEM with cryomicrotomy, vitreous ice sample preparation and cryo-transfer are also available.

TEM/STEM Equipment