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Transmission and Scanning Transmission Electron Microscopy (TEM/STEM)

Determine the microstructure of materials such as grain size, defect density and type, and dislocation distribution; study the local microstructure including heterointerface and individual nanostructures; examine crystalline and amorphous structures; determine the composition of materials from micrometer level down to atomic level. Six instruments with complementary capabilities include atomic resolution (0.19 nm) TEM and analytical scanning TEM with 0.2 nm beam for atomic number (Z-contrast) imaging, EDS, EELS and nanodiffraction. Traditional sample preparation such as ion millers, Cryo TEM with cryomicrotomy, vitreous ice sample preparation and cryo-transfer are also available.

TEM/STEM Equipment

Equipment Name Contact Location
Equipment Name Contact Location
ThermoFisher Glacios Cryo-TEM flatt1 zyw 0026 Supercon

The ThermoFisher Glacios is a high-end, 200kV X-FEG cryogenic transmission electron microscope (CryoTEM) optimized for Single Particle Analysis (SPA), electron tomography, and micro-electron diffraction (microED). The Glacios is equipped with industry-leading Autoloader grid manipulation technology controlled by the ThermoFisher EPU software, allowing users to assess sample quality in a contamination-free environment. The microscope is also equipped with a Volta Phase Plate and Falcon4 Direct Electron Detector, making the Glacios both a stand-alone system for high-resolution SPA data acquisition, and a tool for pre-optimization of sample quality before transfer to a Krios CryoTEM system.

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FEI Themis Z Advanced Probe Aberration Corrected Analytical TEM/STEM cqchen hhzhou B66 MRL

The FEI Themis Z is and advanced analytical scanning/transmission electron microscope (STEM/TEM) from Thermo Fisher Scientific Company that operates between the electron energy of 60 to 300 keV with a Schottky electron emitter, an electron energy monochromator, and a 5th order probe spherical aberration corrector.

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JEOL 2010 LAB6 TEM wswiech cqchen 0017 Supercon

The 2010LaB6 is a conventional TEM. It is optimized for BF/DF imaging, diffraction and high sample tilts.

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JEOL 2100 CRYO TEM wswiech flatt1,cqchen 0011 Supercon

The 2100 Cryo is a conventional TEM with large pole piece gap. It is optimized for BF/DF imaging, diffraction and high sample tilts. Also capable of imaging ultrathin biological tissue sections. It operates at 200kV. The 2100 Cryo is equipped with a combined video rate/slow scan camera for real time imaging and final image recording. It has a low-dose mode. A high tilt is available with +/-70 degrees using a special tip for the single tilt holder. Cryo transfer stage, double tilt heating, and liquid N2 stages are available.

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Hitachi H-9500 Dynamic Environmental TEM cqchen wswiech B66A MRL

The H-9500 is a high resolution 100-300 kV ETEM with a LaB6 electron gun equipped for study of dynamic material reactions down to the atomic scale.

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JEOL 2200 FS (S)TEM cqchen hhzhou B70C MRL

The aberration-corrected JEM-2200FS, a state-of-the-art analytical electron microscope, is equipped with a 200kV field emission gun (FEG), a CEOS probe Cs-corrector, and an in-column energy filter (Omega Filter) that allows elemental analysis and chemical analysis of specimens. It is also equipped with an Energy Dispersive X-ray Spectrometer (EDS) and a CCD-camera. With an available small probe size of ~0.1 nm, atomic level high-resolution high-angle annular dark-field (Z-contrast) images, and high resolution EELS spectrum imaging can be obtained. With the low background Be specimen holder, large (50mm2) detector area, and the hard X-ray aperture, high-quality EDS analysis and mapping is available.

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