The microscopy suite in the Laser and Spectroscopy Facility encompasses a wide variety of instruments for imaging and mapping of material properties. Available modalities include confocal 3D optical profilometry, confocal Raman and fluorescence microscopy, scattering scanning near-field FTIR spectroscopy, C-DIC, TIC, polarization, phase, brightfield, and darkfield. Available geometries are inverted and upright using reflected or transmitted illumination.

Microscopy Equipment

 

Equipment Name Contact Location
Equipment Name Contact Location
Keyence VK-X1000 3D Laser Scanning Confocal Microscope
  • Julio Antonio Nieri D Soares soares
  • Kathy Walsh kawalsh
B80 MRL

The Keyence VK-X1000 employs a 405 nm laser to map and measure the surface of samples through confocal scanning or widefield focus variation.

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Zeiss LSM7 Live
  • Julio Antonio Nieri D Soares soares
  • Kristen M Flatt flatt1
0022 Supercon

The Zeiss LSM 7 Live confocal line-scanning microscope is a fast imaging system capable of 120 frames per second at 512 x 512 pixels, which enable analyzing high-speed processes with a time resolution of a few microseconds.

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Neaspec NanoFTIR/NIM AFM, SSNOM
  • Julio Antonio Nieri D Soares soares
  • Kathy Walsh kawalsh
0022 Supercon

Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolution

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Nanophoton Raman 11
  • Julio Antonio Nieri D Soares soares
  • Mohammad Amdad Ali mali85
0022 Supercon

Fast high-resolution confocal Raman/PL microscopy with excitation at 532 nm and 785 nm.

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Zeiss Axiovert
  • Julio Antonio Nieri D Soares soares
  • Kristen M Flatt flatt1
  • Kathy Walsh kawalsh
0022 Supercon

Conventional widefield inverted materials microscope equipped with C-DIC, TIC, polarization, brightfield, and darkfield in reflected or transmitted illumination.

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Horiba XploRA-nano TERS/TEPL
  • Julio Antonio Nieri D Soares soares
  • Kathy Walsh kawalsh
0022 Supercon

This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-1720633.

The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer.

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