Microscopy
The microscopy suite in the Laser and Spectroscopy Core encompasses a wide variety of instruments for imaging and mapping of material properties. Available modalities include confocal 3D optical profilometry, confocal Raman and fluorescence microscopy, scattering scanning near-field FTIR spectroscopy, C-DIC, TIC, polarization, phase, brightfield, and darkfield. Available geometries are inverted and upright using reflected or transmitted illumination.
Microscopy Equipment
| Equipment Name | Contact | Location | |
|---|---|---|---|
| Equipment Name | Contact | Location | |
| Keyence VK-X1000 3D Laser Scanning Confocal Microscope |
|
B80 MRL |
The Keyence VK-X1000 employs a 404 nm laser to map and measure the surface of samples through confocal scanning or widefield focus variation. |
| LIBS (Laser-Induced Breakdown Spectroscopy) EA-300 |
|
148 MRL |
The EA 300 Series Laser-based Elemental Analyzer from Keyence uses laser-induced breakdown spectroscopy (LIBS) for elemental analysis. |
| Zeiss LSM7 Live Confocal Fluorescence Microscope |
|
0014 Supercon |
The Zeiss LSM 7 Live confocal fluorescence line-scanning microscope is a fast imaging system capable of 120 frames per second at 512 x 512 pixels, which enables analyzing high-speed processes with a time resolution of a few microseconds. |
| Neaspec Nano IR-NIM AFM, SSNOM |
|
0022 Supercon |
Chemical information from FTIR near-field reflection imaging and topographic characterization with 20 nm spatial resolution |
| Nanophoton Raman 11 |
|
0022 Supercon |
Fast high-resolution confocal Raman/PL microscopy with excitation at 532 nm and 785 nm. |
| Zeiss Axiovert Inverted Optical Microscope |
|
0014 Supercon |
Conventional widefield inverted materials microscope equipped with C-DIC, TIC, polarization, brightfield, and darkfield in reflected or transmitted illumination. |
| Horiba XploRA-nano TERS/TEPL |
|
0022 Supercon |
This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-2309037. The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer. |
| Molecular Vista PiFM-Raman |
|
0022 Supercon |
The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm-1. |