Microscopy
The microscopy suite in the Laser and Spectroscopy Facility encompasses a wide variety of instruments for imaging and mapping of material properties. Available modalities include confocal 3D optical profilometry, confocal Raman and fluorescence microscopy, scattering scanning near-field FTIR spectroscopy, C-DIC, TIC, polarization, phase, brightfield, and darkfield. Available geometries are inverted and upright using reflected or transmitted illumination.
Microscopy Equipment
| Equipment Name | Contact | Location | |
|---|---|---|---|
| Equipment Name | Contact | Location | |
| Keyence VK-X1000 3D Laser Scanning Confocal Microscope |
|
B80 MRL | The Keyence VK-X1000 employs a 405 nm laser to map and measure the surface of samples through confocal scanning or widefield focus variation. See More Details |
| Zeiss LSM7 Live |
|
0014 Supercon | The Zeiss LSM 7 Live confocal line-scanning microscope is a fast imaging system capable of 120 frames per second at 512 x 512 pixels, which enable analyzing high-speed processes with a time resolution of a few microseconds. See More Details |
| Neaspec NanoFTIR/NIM AFM, SSNOM |
|
0022 Supercon | Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolution See More Details |
| Nanophoton Raman 11 |
|
0022 Supercon | Fast high-resolution confocal Raman/PL microscopy with excitation at 532 nm and 785 nm. See More Details |
| Zeiss Axiovert |
|
0022 Supercon | Conventional widefield inverted materials microscope equipped with C-DIC, TIC, polarization, brightfield, and darkfield in reflected or transmitted illumination. See More Details |
| Horiba XploRA-nano TERS/TEPL |
|
0022 Supercon | This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-1720633. The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer. See More Details |
| Molecular Vista PiFM-Raman |
|
0022 Supercon | The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm-1. See More Details |