The microscopy suite in the Laser and Spectroscopy Facility encompasses a wide variety of instruments for imaging and mapping of material properties. Available modalities include confocal 3D optical profilometry, confocal Raman and fluorescence microscopy, scattering scanning near-field FTIR spectroscopy, C-DIC, TIC, polarization, phase, brightfield, and darkfield. Available geometries are inverted and upright using reflected or transmitted illumination.

Microscopy Equipment

 

Equipment Name Contact Location
Equipment Name Contact Location
Keyence VK-X1000 3D Laser Scanning Confocal Microscope soares kawalsh 1023 Supercon

The Keyence VK-X1000 employs a 405 nm laser to map and measure the surface of samples through confocal scanning or widefield focus variation.

See More Details
Zeiss LSM7 Live soares flatt1 0022 Supercon

The Zeiss LSM 7 Live confocal line-scanning microscope is a fast imaging system capable of 120 frames per second at 512 x 512 pixels, which enable analyzing high-speed processes with a time resolution of a few microseconds.

See More Details
Neaspec NanoFTIR/NIM AFM, SSNOM soares kawalsh 0022 Supercon

Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolution

See More Details
Nanophoton Raman 11 soares mali85 0022 Supercon

Fast high-resolution confocal Raman/PL microscopy with excitation at 532 nm and 785 nm.

See More Details
Zeiss Axiovert soares kawalsh,flatt1 0022 Supercon

Conventional widefield inverted materials microscope equipped with C-DIC, TIC, polarization, brightfield, and darkfield in reflected or transmitted illumination.

See More Details
Horiba XploRA-nano TERS/TEPL soares kawalsh 0022 Supercon

This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-1720633.

The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer.

See More Details