Probe Stations
Probe Stations Equipment
| Equipment Name | Contact | Location | |
|---|---|---|---|
| Equipment Name | Contact | Location | |
| 4155c Semiconductor Parameter Analyzer (Agilent), used with Lake Shore and custom probe station |
|
326 MRL | |
| Bench Top Probe Station (Custom) |
|
326 MRL | |
| Temperature-Controlled Cryogenic Vacuum Probe Station |
|
326 MRL |
The LakeShore FWPX Cryogenic Probe Station is a great characterization tool for taking electrical measurements in a temperature range from 77 K up to 475 K, and in a vacuum environment down to 10-5 Torr. The electrical signals are taken through the Agilent 4155C Semiconductor Parameter Analyzer which has 4 SMU units with a voltage output range of -100 to 100 V and a current output range of -100 to 100 mA. Users can perform temperature-dependent measurements of I-V and quasi-static C-V curves, and other high and low frequency tests. An optical camera with 10 μm spatial resolution is available for sample alignment. |