Probe Stations
Probe Stations Equipment
Equipment Name | Contact | Location | |
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Equipment Name | Contact | Location | |
4155c Semiconductor Parameter Analyzer (Agilent), used with Lake Shore and custom probe station |
|
326 MRL | |
Bench Top Probe Station (Custom) |
|
326 MRL | |
Temperature-Controlled Cryogenic Vacuum Probe Station |
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326 MRL | The LakeShore FWPX Cryogenic Probe Station is a great characterization tool for taking electrical measurements in a temperature range from ~ 10 K (when using liquid Helium) or 77 K (when using liquid Nitrogen) up to 475 K, and in a vacuum environment down to 10-5 Torr. The electrical signals are taken through the Agilent 4155C Semiconductor Parameter Analyzer which has 4 SMU units with a voltage output range of -100 to 100 V and a current output range of -100 to 100 mA. Users can perform temperature-dependent measurements of I-V and C-V curves, and other high and low frequency tests. See More Details |