X-Ray Analysis
MRL’s X-Ray analysis suite provides instrumentation for analysis of crystalline structure, orientation and texture, stress, chemical composition, grain and particle size distribution applied to various materials system in powder, thin film on substrate, bulk and liquid form. Dedicated instruments are available for powder, thin film, glancing incidence, texture, stress, reciprocal lattice mapping, fluorescence and reflectometry analysis. The lab also includes a dedicated SAXS/WAXS system for small and wide angles x-ray scattering. Materials databases and software packages are available for search/match, structure refinement, rocking curve and reflectometry simulation and fitting.
Techniques
X-Ray Diffraction (XRD) and Scattering
Several x-ray diffraction (XRD) systems, under Bragg-Brentano, parallel beam, high-resolution and microdiffraction configurations, are available for the analysis of crystalline structure, texture, stress, composition, etc. The lab includes instrumentation for single crystal orientation analysis via real-time Laue, in addition to reflectometry (XRR), SAXS, WAXS and energy-dispersive x-ray fluorescence (XRF). Environmental stages for sample analysis under temperature and humidity controlled conditions are available for some of the XRD, XRR and SAXS/WAXS tools.
X-Ray Data Analysis Software Packages
Access advanced powder diffraction and chemistry databases and use advanced software analysis tools to help in your research.
Equipment in this Core
| Equipment Name | Contact | Location | Techniques | |
|---|---|---|---|---|
| Equipment Name | Contact | Location | Techniques | |
| Bruker D8 Advance XRD System with High-Temperature Sample Stage |
|
148 MRL |
|
|
| Shimadzu EDX-7000 Energy-Dispersive X-Ray Fluorescence Spectrometer |
|
148 MRL |
|
Fast measurements in a small, table-top foot print, automated analysis of up to 12 samples in a single run. Radiation: non-monochromatic or filtered Rh x-ray source See More Details |
| Laue System with Multiwire 2D Detector |
|
148 MRL |
|
Back-scattering Laue with data acquisition using a fast 2D detector; sample stage with multi-axis rotations and full translation capabilities controlled by multi-function joystick allowing for real time sample movement/rotation with simultaneous data visualization; optical camera setup to allow for precision alignment of sub-mm crystals or exploration of the position dependence of diffraction patterns. Laue pattern processing and indexing using NorthStar Real-Time Orientation software. See More Details |
| Small Angle X-Ray Scattering System with Pilatus 300 Detector |
|
148 MRL |
|
High-speed SAXS, WAXS, GI-SAXS, GI-WAXS data collection using a three-module Pilatus 300 detector with optional environmental controls. See More Details |
| PANalytical Phillips X’pert MRD system #2 |
|
148 MRL |
|
The PANalytical MRD system #2 features: theta/2theta vertical four-circle system with phi, psi rotations and x,y,z sample translation, proportional detector and high-speed PIXcel line detector (pixel size 55 microns). Radiation / wavelength: Cu K-alpha, 0.15418 nm See More Details |
| Siemens/Bruker D-5000 XRD System |
|
148 MRL |
|
The Siemens/Bruker D-5000 features: theta/theta vertical goniometer system with optional spinner (phi) rotation (Bragg Brentano configuration). Radiation /wavelength: Cu K-alpha, 0.15418 nm Main optics: soller slits, divergence slit, scatter slit, receiving slit, detector slit, curved graphite monochromator, scintillation detector See More Details |