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MRL’s X-Ray analysis suite provides instrumentation for analysis of crystalline structure, orientation and texture, stress, chemical composition, grain and particle size distribution applied to various materials system in powder, thin film on substrate, bulk and liquid form. Dedicated instruments are available for powder, thin film, glancing incidence, texture, stress, reciprocal lattice mapping, fluorescence and reflectometry analysis. The lab also includes a dedicated SAXS/WAXS system for small and wide angles x-ray scattering. Materials databases and software packages are available for search/match, structure refinement, rocking curve and reflectometry simulation and fitting.


X-Ray Diffraction (XRD) and Scattering

Several x-ray diffraction (XRD) systems, under Bragg-Brentano, parallel beam, high-resolution and microdiffraction configurations, are available for the analysis of crystalline structure, texture, stress, composition, etc. The lab includes instrumentation for single crystal orientation analysis via real-time Laue, in addition to reflectometry (XRR), SAXS, WAXS and energy-dispersive x-ray fluorescence (XRF). Environmental stages for sample analysis under temperature and humidity controlled conditions are available for some of the XRD, XRR and SAXS/WAXS tools.

X-Ray Data Analysis Software Packages

Access advanced powder diffraction and chemistry databases and use advanced software analysis tools to help in your research.

Equipment in this Core

Equipment Name Contact Location Techniques
Equipment Name Contact Location Techniques
Bruker D8 Advance XRD System with High-Temperature Sample Stage jslopez sardela 148 MRL X-Ray Diffraction (XRD) and Scattering
Shimadzu EDX-7000 Energy-Dispersive X-Ray Fluorescence Spectrometer mali85 jslopez 148 MRL X-Ray Diffraction (XRD) and Scattering

Fast measurements in a small, table-top foot print, automated analysis of up to 12 samples in a single run. Radiation: non-monochromatic or filtered Rh x-ray source

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Laue System with Multiwire 2D Detector gmacdoug jslopez 148 MRL X-Ray Diffraction (XRD) and Scattering

Back-scattering Laue with data acquisition using a fast 2D detector; sample stage with multi-axis rotations and full translation capabilities controlled by multi-function joystick allowing for real time sample movement/rotation with simultaneous data visualization. Laue pattern processing and indexing using NorthStar Real-Time Orientation software.

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Small Angle X-Ray Scattering System with Pilatus 300 Detector jslopez sardela 148 MRL X-Ray Diffraction (XRD) and Scattering

High-speed SAXS, WAXS, GI-SAXS, GI-WAXS data collection using a three-module Pilatus 300 detector with optional environmental controls.

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PANalytical Phillips X’pert MRD system #2 sardela jslopez 148 MRL X-Ray Diffraction (XRD) and Scattering

The PANalytical MRD system #2 features: theta/2theta vertical four-circle system with phi, psi rotations and x,y,z sample translation, proportional detector and high-speed PIXcel line detector (pixel size 55 microns). Radiation / wavelength: Cu K-alpha, 0.15418 nm

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Siemens/Bruker D-5000 XRD System jslopez sardela 148 MRL X-Ray Diffraction (XRD) and Scattering

The Siemens/Bruker D-5000 features: theta/theta vertical goniometer system with optional spinner (phi) rotation (Bragg Brentano configuration). Radiation /wavelength: Cu K-alpha, 0.15418 nm Main optics: soller slits, divergence slit, scatter slit, receiving slit, detector slit, curved graphite monochromator, scintillation detector

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