J.A. Woollam VASE

 

 

 

 

 

 

 

For spectroscopic ellipsometry.

Features:

  • Measure optical constants and thickness of multilayers or bulk materials, as well as reflectance and transmission as a function of angle of incidence, polarization, and wavelength.
  • Wavelength range: 240 nm to 1700 nm;
  • Angle of incidence: 12° to 90°; Temperature: 10 K to 700 K 
  • New camera to inspect the exact area of the sample being probed (as small as 100 µm diameter spot size with focusing probes)

Resources:

Ellipsometry Tutorial

Ellipsometry Spreadsheet

Contact

MRL Facilities Postdoctoral Associate