Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) instruments are available for scanning in air, or other gases, or liquids within a wide variety of imaging and measurement modes, plus nanomanipulation. All of our instruments have sub-angstrom vertical resolution, as lateral resolution is generally limited by the tip geometry, not the instrument.
AFM tip distributors
NOTE: Commonly used tips and sample supplies are available for purchase in the MRL storeroom.
We most commonly use BS-Tap300Al tapping tips from BudgetSensors and for extra sharp tips, SuperSharpSilicon from Nanosensors. Both are carried in the storeroom.
Some other good sources of AFM tips:
- Nano and More USA, US distributor for BudgetSensors, NanoWorld and Nanosensors.
- Ted Pella, Inc., another distributor for BudgetSensors tips and other microscopy supplies.
- Asylum Research, distributors for Nanosensors and Olympus.
- Nanoscience Instruments, US distributor for VistaProbes, plus carbon nanotube tips (and a great resource for nanoscience educators).
- MikroMasch, many types, including the Hi-Res one nanometer tips.
- Novascan Technologies, functionalized tips with defined chemistries.
|Neaspec NanoFTIR/NIM AFM, SSNOM||
Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolutionSee More Details
|Horiba XploRA-nano TERS/TEPL||
This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-1720633.
The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer.See More Details
|Asylum Research Cypher||
The Cypher is a state-of-the-art AFM from Asylum Research, featuring exceptionally low noise and fast scanning capabilities in addition to advanced scanning modes in air or liquid environments. Maximum lateral scan size on this instrument is 30 µm x 30 µm, and maximum vertical range is 5 µm.See More Details
|Asylum Research MFP-3D AFM||
These two AFMs from Asylum Research feature closed-loop, low noise, high precision scanners, with Q-controlled AC modes (with phase imaging), piezo response imaging, contact mode with lateral force, and detailed force-distance measurements. These systems allow scanning in air or liquid environments, and have extensive nanomanipulation and nanolithography capabilities. Maximum lateral scan size on these instruments is 90 µm x 90 µm, and maximum vertical range is 15 µm.See More Details