Molecular Vista PiFM-Raman

The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm^-1.  The strength of this technique is obtaining chemical information on surfaces with AFM-scale resolution.

This instrument is capable of photo-induced force microscopy (PiFM), photo-induced force infrared spectroscopy (PiF-IR), Raman spectroscopy, and non-optical AFM techniques such as Kelvin probe force microscopy (KPFM), electrostatic force microscopy (EFM), magnetic force microscopy (MFM), tapping and contact imaging modes, and force curves.

Photo-induced force microscopy (PiFM) and photo-induced force infrared spectroscopy (PiF-IR) are complementary to FTIR (https://molecularvista.com/technology/comparisons/pif-ir-vs-ftir/), Raman and TERS, and AFM.