X-Ray Diffraction (XRD) and Scattering

Several x-ray diffraction (XRD) systems, under Bragg-Brentano, parallel beam, high-resolution and microdiffraction configurations, are available for the analysis of crystalline structure, texture, stress, composition, etc. The lab includes instrumentation for single crystal orientation analysis via real-time Laue, in addition to reflectometry (XRR), SAXS, WAXS and energy-dispersive x-ray fluorescence (XRF). Environmental stages for sample analysis under temperature and humidity controlled conditions are available for some of the XRD, XRR and SAXS/WAXS tools.

X-Ray Diffraction and Scattering