Bruker D8 Advance XRD/XRR System with High-Temperature Sample Stage

This tool was purchased with funds from the Illinois Materials Research Science and Engineering Center (I-MRSEC). Please include the following acknowledgement in all your scientific publications that benefited from the use of this equipment:

“This work was carried out in part in the Materials Research Laboratory Central Research Facilities, University of Illinois, using equipment funded through Illinois MRSEC, NSF Award DMR-2309037.”

Also, please use the following link to report your publications (DOI or full reference) that acknowledge the use of the MRL facilities in general:

https://go.illinois.edu/MRLpublication

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Our Bruker D8 Advance diffractometer includes a vertical theta/theta goniometer with independent rotation of the x-ray tube, x-ray detector, sample stage tilt and spinning. The D8 employs a multiple configurations which can be easily selected from the instrument control software between three main options via Bruker’s TRIO optics:

• Line focus Bragg Brentano configuration using programmable divergence slits.
• Line focus parallel beam configuration using a Goebel x-ray mirror in the primary optics.
• Line focus high-resolution configuration with a Goebel x-ray mirror and a double-bounce Ge(004) monochromator (“channel cut configuration”) in the primary optics.

An optional point focus configuration using pinhole configuration is also available.

All major x-ray diffraction (XRD) and reflectivity (XRR) applications are available in this system.

The system uses the Eigher2 R 500 K detector with 75 microns pixel size, with a total of 1,030 x 514 pixels, with 2.5x10⁸ photons per sec per mm² capacity. The detector can be used in 0D (point detector), 1D (line) or 2D (areal) modes  which are easily selected and configured using the instrument control software.

Additional features:

• Cu source and TRIO primary optics using Cu K-alpha or Cu K-alpha1 radiation.
• Heating chamber for in situ XRD up to 1200^oC.
• Four-circle sample stage.
• Powder XRD.
• Thin film and grazing incidence XRD.
• High resolution epitaxial and single crystal materials.
• Reciprocal space mapping.
• Texture and stress analysis.
• X-ray reflectivity.
• EVA data analysis and profile fitting software; TOPAS structure refinement software; Leptos software for stress and reflectometry analysis.

Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS.