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Bruker D8 Advance XRD System with High-Temperature Sample Stage

This equipment was partially funded through the Illinois MRSEC NSF Award Number DMR-1720633.



  • 2D Eiger2 R 500K detector
  • Heating chamber for in situ XRD up to 1200oC
  • Four-circle sample stage
  • All major applications included in one system
  • Cu source and TRIO primary optics
  • Powder XRD
  • Thin film and grazing incidence XRD
  • High resolution epitaxial and single crystal materials
  • Reciprocal space mapping
  • Texture and stress analysis
  • TOPAS structure refinement software

Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS


Director of Research Facilities