Bruker D8 Advance XRD System with High-Temperature Sample Stage

This equipment was partially funded through the Illinois MRSEC NSF Award Number DMR-1720633. Its use should be acknowledged in any published works, with the wording: “The authors acknowledge the use of facilities and instrumentation at the Materials Research Laboratory Central Research Facilities, University of Illinois, partially supported by NSF through the University of Illinois Materials Research Science and Engineering Center DMR-1720633.” Please also send a copy of the publication (email or hard copy), or the publication information (citation, DOI, or conference name and paper/poster title) to




  • 2D Eiger2 R 500K detector
  • Heating chamber for in situ XRD up to 1200oC
  • Four-circle sample stage
  • All major applications included in one system
  • Cu source and TRIO primary optics
  • Powder XRD
  • Thin film and grazing incidence XRD
  • High resolution epitaxial and single crystal materials
  • Reciprocal space mapping
  • Texture and stress analysis
  • TOPAS structure refinement software

Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS


Research Scientist