Bruker D8 Advance XRD/XRR System with High-Temperature Sample Stage

This equipment was partially funded through the Illinois MRSEC NSF Award Number DMR-2309037. Its use should be acknowledged in any published works, with the wording: “The authors acknowledge the use of facilities and instrumentation at the Materials Research Laboratory Central Research Facilities, University of Illinois, partially supported by NSF through the University of Illinois Materials Research Science and Engineering Center DMR-DMR-2309037.” Please also send a copy of the publication (email or hard copy), or the publication information (citation, DOI, or conference name and paper/poster title) to mrl-facilities@illinois.edu.

Our Bruker D8 Advance diffractometer includes a vertical theta/theta goniometer with independent rotation of the x-ray tube, x-ray detector, sample stage tilt and spinning. The D8 employs a multiple configurations which can be easily selected from the instrument control software between three main options via Bruker’s TRIO optics:

• Line focus Bragg Brentano configuration using programmable divergence slits.
• Line focus parallel beam configuration using a Goebel x-ray mirror in the primary optics.
• Line focus high-resolution configuration with a Goebel x-ray mirror and a double-bounce Ge(004) monochromator (“channel cut configuration”) in the primary optics.

An optional point focus configuration using pinhole configuration is also available.

All major x-ray diffraction (XRD) and reflectivity (XRR) applications are available in this system.

The system uses the Eigher2 R 500 K detector with 75 microns pixel size, with a total of 1,030 x 514 pixels, with 2.5x10⁸ photons per sec per mm² capacity. The detector can be used in 0D (point detector), 1D (line) or 2D (areal) modes  which are easily selected and configured using the instrument control software.

Additional features:

• Cu source and TRIO primary optics using Cu K-alpha or Cu K-alpha1 radiation.
• Heating chamber for in situ XRD up to 1200^oC.
• Four-circle sample stage.
• Powder XRD.
• Thin film and grazing incidence XRD.
• High resolution epitaxial and single crystal materials.
• Reciprocal space mapping.
• Texture and stress analysis.
• X-ray reflectivity.
• EVA data analysis and profile fitting software; TOPAS structure refinement software; Leptos software for stress and reflectometry analysis.

Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS.