Bruker D8 Advance XRD System with High-Temperature Sample Stage
Equipment Location:
148 MRL
This equipment was partially funded through the Illinois MRSEC NSF Award Number DMR-1720633.
Features:
- 2D Eiger2 R 500K detector
- Heating chamber for in situ XRD up to 1200oC
- Four-circle sample stage
- All major applications included in one system
- Cu source and TRIO primary optics
- Powder XRD
- Thin film and grazing incidence XRD
- High resolution epitaxial and single crystal materials
- Reciprocal space mapping
- Texture and stress analysis
- TOPAS structure refinement software
Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS