Bruker D8 Advance XRD System with High-Temperature Sample Stage

This equipment was partially funded through the Illinois MRSEC NSF Award Number DMR-1720633.

 

 

Features:

• 2D Eiger2 R 500K detector
• Heating chamber for in situ XRD up to 1200^oC
• Four-circle sample stage
• All major applications included in one system
• Cu source and TRIO primary optics
• Powder XRD
• Thin film and grazing incidence XRD
• High resolution epitaxial and single crystal materials
• Reciprocal space mapping
• Texture and stress analysis
• TOPAS structure refinement software

Features and application of the D8 XRD system in the MRL - presentation by Dr. Benjamin Krueger, Bruker-AXS