Siemens/Bruker D-5000 XRD System

The Siemens/Bruker D-5000 features:
theta/theta vertical goniometer system with optional spinner (phi) rotation (Bragg Brentano configuration).

Radiation /wavelength: Cu K-alpha, 0.15418 nm

Main optics: soller slits, divergence slit, scatter slit, receiving slit, detector slit, curved graphite monochromator, scintillation detector

Applications

• Powder and polycrystalline bulk materials; limited applicability to soft samples.
• Phase identification, composition quantification, crystallographic structure determination.
• Crystallite / grain size and strain analysis.
• Limited texture (preferred orientation) analysis.