Scanning Probe Microscopy
The scanning probe suite at MRL comprises a variety of instruments with complementary capabilities that enable the measurement of sample topography down to atomic resolution, local electromagnetic properties, and nanomechanical properties.
Techniques
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) instruments are available for scanning in air, or other gases or liquids, using a wide variety of imaging and measurement modes, plus nanomanipulation. All of our instruments have sub-angstrom vertical resolution. Lateral resolution is generally limited by the tip geometry, not the instrument.
Nanoindentation
Surface Profilometry
Scanning Probe Optical Spectroscopy
Atomic force microscopy and optical characterization combine to give surface chemical information.
Equipment in this Core
| Equipment Name | Contact | Location | Techniques | |
|---|---|---|---|---|
| Equipment Name | Contact | Location | Techniques | |
| Optics 11 Life Piuma Nanoindenter |
|
0013 Supercon |
|
The Optics 11 Life Piuma soft materials nanoindenter uses cantilever-based nanoindentation (similar to AFM force curves) to determine the Young’s modulus of samples ranging from a few tens of Pascals to 1 GPa. The Piuma is generally more user-friendly and versatile to work with than a traditional AFM, especially for biological samples, without compromising data quality. Operation in air or fluid and automated grids of indentations are simple to set up. Probes are constructed with spherical borosilicate glass tips ranging from 6 – 500 µm diameter (similar to colloidal probe AFM design). (Please inquire in advance whether your samples satisfy the biosafety level requirements of the MRL). Sample Conditions Supported by the Piuma:
Piuma Technical Specifications
|
| Neaspec Nano IR-NIM AFM, SSNOM |
|
0022 Supercon |
|
Chemical information from FTIR near-field reflection imaging and topographic characterization with 20 nm spatial resolution |
| Horiba XploRA-nano TERS/TEPL |
|
0022 Supercon |
|
This equipment was funded through the Illinois MRSEC, NSF Award Number DMR-2309037. The XploRA PLUS Raman Microscope head-based tip-enhanced Raman spectroscopy (TERS) and tip enhanced photoluminescence (TEPL) from Horiba, Inc. is a fully integrated TERS/TEPL system based on SmartSPM state of the art scanning probe microscope (SPM) and XploRA Raman micro-spectrometer. |
| Molecular Vista PiFM-Raman |
|
0022 Supercon |
|
The Vista One PiFM-Raman microscope from Molecular Vista enables nano-IR measurements with very high resolution (~10nm lateral resolution for mapping and spectroscopy) in the wavenumber range 1908 - 752 cm-1. |
| Sloan Dektak3ST Profilometer |
|
B80 MRL |
|
Surface profilometry is a contact measurement technique in which a diamond-tipped stylus is used to measure surface topography as it moves across the surface of a specimen. |
| Hysitron TI-950 TriboIndenter |
|
0013 Supercon |
|
The Hysitron TI 950 TriboIndenter at the Materials Research Laboratory is a versatile instrument with capabilities beyond traditional quasistatic nanoindentation. In addition to a standard transducer which can apply micronewton-to-few-mN loads over a displacement range of several micrometers, a high load transducer allows indents to be made at loads of up to 2.8 N over a displacement of up to 90 microns. |
| Asylum Research Cypher STM |
|
B12 MRL |
|
In Scanning Tunneling Microscopy (STM), an electrically-biased tip is scanned very close to a surface (about an atomic diameter away). The current flow between the tip and the sample (due to quantum tunneling) strongly depends on the tip-surface gap; this relationship can be used to generate a surface topography map. Atomic-scale topographic resolution is achievable. All samples for STM must be at least somewhat electrically conductive. STM mode on the Cypher serves in part as a testbed for determining whether STM is a viable experimental technique for samples before investing effort into UHV STM measurements. Additionally, the ambient conditions on this instrument permit STM measurements of samples which may not respond well to vacuum environments. This STM can do imaging and I-V curves but is not currently able to perform dI/dV measurements. |
| Asylum Research Cypher |
|
B12 MRL |
|
The Cypher is a state-of-the-art AFM from Asylum Research, featuring exceptionally low noise and fast scanning capabilities in addition to advanced scanning modes in air or liquid environments. Maximum lateral scan size on this instrument is 30 µm x 30 µm, and maximum vertical range is 5 µm. |
| Asylum Research MFP-3D AFM |
|
B12 MRL |
|
These two AFMs from Asylum Research feature closed-loop, low noise, high precision scanners, with Q-controlled AC modes (with phase imaging), piezo response imaging, contact mode with lateral force, and detailed force-distance measurements. These systems allow scanning in air or liquid environments, and have extensive nanomanipulation and nanolithography capabilities. Maximum lateral scan size on these instruments is 90 µm x 90 µm, and maximum vertical range is 15 µm. |
| Asylum Research MFP-3D-Bio AFM |
|
0026 Supercon |
|
This AFM is on an inverted optical brightfield/fluorescence microscope and is in a Biosafety Level 2 lab. The MFP-3D-Bio from Asylum Research (with optional brightfield/fluorescence microscopy integration) features a closed-loop, low noise, high precision scanner for use with samples in air or fluid. Maximum lateral scan size is 90 µm x 90 µm, and maximum vertical range is 28 µm (closed loop, or 40 µm open loop). |