ThermoFisher Scientific Talos F200X G2 Scanning Transmission Electron Microscope (S/TEM)

ThermoFisher Scientific Talos F200X G2 Scanning Transmission Electron Microscope (S/TEM)

The Talos F200X G2 is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM) that combines outstanding quality in high-resolution STEM and TEM imaging with high throughput EDS signal detection and 3D chemical characterization with compositional mapping. It is designed for fast, precise and quantitative characterization of nano-materials. It accelerates nano-analysis of materials based on higher data quality, faster acquisition, and simplified and automated operation. The system’s Constant-Power™ X-TWIN lens delivers outstanding optical performance to help ensure an optimal balance of contrast and resolution.

The microscope comes with numerous advanced functions and new features:

 X-FEG high-brightness electron source for high brightness, high temporal and spatial coherence.

• Constant-Power Objective lens control stabilizes the optics while switching between various optical modes.
• Lorentz Lens enabling imaging magnetic structures in field-free conditions.
• The EMPAD (Electron Microscope Pixelated Array Detector) pixelated detector for acquiring the diffraction pattern in each pixel of a STEM image, with the speed of up to 1100 fps.
• 4k x 4k Ceta™ 16M camera with Speed Enhancement provides fast frame rate imaging up to 40 fps at full frames, and 300 FPS for reduced frame size.
• The 4D STEM software package for the Ceta™ 16M camera, synchronizes the STEM spot movement with the readout of the camera.
• Super-X SDD EDS detection system with 4 large area crystals, and large EDS collection solid angle of 0.7 steradians for high count rate and high-resolution EDS analysis.
• Segmented Panther STEM detector, along with HAADF detector, provides access to a large range of BF and DF STEM imaging techniques with 4k x 4k STEM image acquisition.
• TEM Tomography, STEM Tomography, and EDS Tomography data acquisition software packages provide capability to obtain 3D structure and chemical information.
• Inspect3D Xpress hardware and software for carrying out alignment of tomography data and subsequent ultra-fast tomographic reconstruction
• Maps 3 S/TEM image acquisition and processing software for automatically acquiring images from a large area by shifting the CompuStage and stitching all the images into a final image.
• Velox™ software for multi-signal simultaneous acquisition guides the typical workflow of STEM imaging, EDS acquisition and analysis, and special applications: DPC / iDPC (Differential Phase Contrast / Integrated DPC), and drift-corrected frame imaging (DCFI).
• Align Genie fully automated software for aligning and (fine-) tuning the optics and column alignments in TEM mode.
• AutoSTEM automated alignment software for the correction of focus and astigmatism correction in STEM mode up to 1 Mx magnification.
• Computerized 5-axes Piezo enhanced stage ensures drift-free imaging with high sensitivity and precise sample navigation.
• Fully computer controlled and motorized apertures whose alignments and positions are automatically recalled.
• A new high speed, high dynamic range, damage insensitive digital Search and View Camera SmartCam replacing conventional fluorescent screen.
• Instrument enclosure that moderates the impact from the air pressure waves, air flows, and fine temperature variations in the TEM room.
• Probe current and STEM detector collection angles indicated in real time in TEM user interface.
• The microscope will be installed  with column alignments at 80, 100 and 200 kV.

Specifications:

• HRTEM line resolution:  0.10 nm
• HRSTEM:                             0.16 nm
• Brightness of X-FEG:       1.8 × 109 A /cm2 srad (@200kV)
• Super-X EDS system:      4 SDD symmetric design, windowless, shutter-protected
• Energy resolution:           ≤136 eV for Mn-Kα and 10 kcps (output)