Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) instruments are available for scanning in air, or other gases, or liquids within a wide variety of imaging and measurement modes, plus nanomanipulation. All of our instruments have sub-angstrom vertical resolution, as lateral resolution is generally limited by the tip geometry, not the instrument.

AFM Equipment

AFM Resources

AFM tip distributors

NOTE: Commonly used tips and sample supplies are available for purchase in the MRL storeroom.
We most commonly use BS-Tap300Al tapping tips from BudgetSensors and for extra sharp tips, SuperSharpSilicon from Nanosensors. Both are carried in the storeroom.

Some other good sources of AFM tips: