Bench Top Probe Station (Custom)

The Probe Station facilitates electrical measurements at room temperature and in ambient conditions. Electrical contact is made via probe tips (5 µm tungsten standard) which are attached to micropositioners with 80 turns per inch resolution. The electrical signals are taken through the Agilent 4155C Semiconductor Parameter Analyzer which has 4 SMU units with a voltage output range of -100 to 100 V and a current output range of  -100 to 100 mA. Users can perform temperature-dependent measurements of I-V and quasi-static C-V curves, and other high and low frequency tests.


Research Assistant Professor, MRL