Neaspec Nano IR-NIM AFM, SSNOM

Our AFM FTIR/SNOM instrument from Neaspec (“nanoFTIR/NIM”) is capable of FTIR imaging in the mid-IR range (700 to 2200 cm^-1) with a resolution of a few tens of nanometers. The scattering scanning near-field optical microscopy technique provides chemical information from FTIR near-field reflection imaging and topographic characterization with 20 nm spatial lateral resolution. Sample measurement area is ~100 x 100 µm². The instrument features the mid-IR imaging module, which allows acquisition of images at a particular wavelength in the mid-IR, showing where absorption for that wavelength is happening on the sample.