Advanced Materials Characterization 2024

Illinois Materials Research Laboratory
University of Illinois at Urbana-Champaign

Tuesday & Wednesday, June 4 & 5, 2024

The workshop provides an overview and critical comparison of major analytical techniques for materials characterization (AFM, SEM, TEM, XRD, DSC, Raman, XPS, etc.) with emphasis on practical applications in Engineering and the Physical and Life Sciences. Presentations and instrument demonstrations span basic to advanced topics suitable for both novice and experienced scientists. Walk-through examples focus on problem-solving strategies, instrument resolution requirements, potential artifacts in data collection, and tips for data interpretation.

Topics include:

Atomic force microscopy (AFM) and nanoindentation
Scanning and electron microscopy (SEM, TEM, STEM) including energy dispersive x-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS)
Focused ion beam (FIB) for sample preparation and nanofabrication
Ellipsometry, FTIR, Raman, photoluminescence, confocal microscopy, and spectroscopy in general
X-ray photoelectron spectroscopy (XPS)
Atom probe tomography (APT) and Rutherford backscattering spectroscopy (RBS)
X-ray diffraction (XRD), reflectivity (XRR), fluorescence (XRF) and small-angle x-ray scattering (SAXS)
Differential scanning calorimetry (DSC), differential thermal analysis (DTA), particle size analysis, thermogravimetric analysis (TGA)
Cryo electron microscopy (cryo-EM) including sample prep and vitrification of biological specimens.

Presenters:

MRL staff scientists with years of hands-on experience in materials characterization
Industrial scientists introducing new technology and new instrumentation

Special events:

Vendor exhibit show with live instrument demos and scientists on-site discussing advanced applications
Several networking opportunities including evening reception, breaks and lunches
Tours of the MRL laboratories