2017 Advanced Materials Characterization (AMC) Workshop a Big Hit

The Advanced Materials Characterization (AMC) workshop was a big hit this year.  Attendance reached a new record with approximately 250 attendees from all across the country, from 30 universities and industries, plus 25 corporate sponsors and 19 on-campus units. 

 

The two-day workshop was filled with demonstrations, presentations, networking, and some really great coffee breaks, of course. Demonstrations were given by eight MRL research scientists on topics that ranged from optical characterization methods to transmission electron microscopy (TEM); eight industrial companies presented on new technology and best practices to help researchers. 

 

The first day of AMC captivated the audience with the following presentations:

Julio Soares on optical characterization methods; Tim Spila on rutherford backscattering spectrometry; Kathy Walsh on atomic force microscopy; Wacek Swiech on scanning electron microscopy; and Mauro Sardela on X-ray analysis methods (XRD, XRR, SAXS). Company presentations were given by Renishaw Inc., Neaspec GmbH/ DMS, Keysight Technologies, and Kurt J. Lesker Co.  

 

Many pieces of research advice and insight were given by the presenters, with a lot of wit and wisdom interwoven. “I have three pieces of advice for you,” said research scientist Julio Soares. “One, it is very important to do careful data analysis; two, it is very important to use complementary techniques; and three, superheroes are disguised as human beings in our lives, so get to know all the human beings you can.” 

 

Day two of the AMC workshop consisted of demonstrations from Lou Ann Miller on biological microscopy techniques; Rick Haasch on X-ray photoelectron spectroscopy/auger electron spectroscopy; Tim Spila on secondary ion mass spectrometry; Kathy Walsh on dynamic light scattering (DLS), thermogravimetric analysis (TGA), dynamic mechanical analysis (DMA), and then later on nanoindentation; and Wacek Swiech with Changqiang “CQ” Chen on transmission electron microscopy (TEM). Company presentations were mixed in with the MRL staff demos given by University of Illinois, Shimadzu Scientific Instruments, CAMECA Instruments, and Anton Paar. 

 

“The mission of the MRL is to advance materials science,” MRL Director Paul Braun said to the AMC crowd. “We welcome you to the workshop, but more importantly, we welcome you to the MRL.” 

 

Did you miss the workshop this year? This is an annual event; stay in touch to learn more about AMC 2018 when information comes out. 

Coffee breaks are great for additional conversation about materials research.
Coffee breaks are great for additional conversation about materials research.

Mauro Sardela addresses the audience at AMC 2017.
Mauro Sardela addresses the audience at AMC 2017.