Transmission and Scanning Transmission Electron Microscopy (TEM/STEM)

Determine the microstructure of materials such as grain size, defect density and type, and dislocation distribution; study the local microstructure including heterointerface and individual nanostructures; examine crystalline and amorphous structures; determine the composition of materials from micrometer level down to atomic level. Six instruments with complementary capabilities include atomic resolution (0.19 nm) TEM and analytical scanning TEM with 0.2 nm beam for atomic number (Z-contrast) imaging, EDS, EELS and nanodiffraction. Traditional sample preparation such as ion millers, Cryo TEM with cryomicrotomy, vitreous ice sample preparation and cryo-transfer are also available.

TEM/STEM Equipment

Equipment Name Contact Location
Equipment Name Contact Location
ThermoFisher Glacios Cryo-TEM
  • Kristen M Flatt flatt1
  • Ying He yinghe2
0026 Supercon

The ThermoFisher Glacios is a high-end, 200kV X-FEG cryogenic transmission electron microscope (CryoTEM) optimized for Single Particle Analysis (SPA), electron tomography, and micro-electron diffraction (microED). The Glacios is equipped with industry-leading Autoloader grid manipulation technology controlled by the ThermoFisher EPU software, allowing users to assess sample quality in a contamination-free environment. The microscope is also equipped with a Volta Phase Plate and Falcon4 Direct Electron Detector, making the Glacios both a stand-alone system for high-resolution SPA data acquisition, and a tool for pre-optimization of sample quality before transfer to a Krios CryoTEM system.

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FEI Themis Z Advanced Probe Aberration Corrected Analytical TEM/STEM
  • Changqiang Chen cqchen
  • Honghui Zhou hhzhou
B66 MRL

The FEI Themis Z is and advanced analytical scanning/transmission electron microscope (STEM/TEM) from Thermo Fisher Scientific Company that operates between the electron energy of 60 to 300 keV with a Schottky electron emitter, an electron energy monochromator, and a 5th order probe spherical aberration corrector.

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ThermoFisher Scientific Talos F200X G2 Scanning Transmission Electron Microscope (S/TEM)
  • Changqiang Chen cqchen
  • Honghui Zhou hhzhou
B70C MRL

The Talos F200X G2 is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM) that combines outstanding quality in high-resolution STEM and TEM imaging with high throughput EDS signal detection and 3D chemical characterization with compositional mapping. It is designed for fast, precise and quantitative characterization of nano-materials. It accelerates nano-analysis of materials based on higher data quality, faster acquisition, and simplified and automated operation. The system’s Constant-Power™ X-TWIN lens delivers outstanding optical performance to help ensure an optimal balance of contrast and resolution.

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JEOL 2010 LAB6 TEM
  • Wacek Swiech wswiech
  • Changqiang Chen cqchen
0017 Supercon

The 2010LaB6 is a conventional TEM. It is optimized for BF/DF imaging, diffraction and high sample tilts.

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JEOL 2100 CRYO TEM
  • Wacek Swiech wswiech
  • Changqiang Chen cqchen
  • Kristen M Flatt flatt1
0011 Supercon

The 2100 Cryo is a conventional TEM with large pole piece gap. It is optimized for BF/DF imaging, diffraction and high sample tilts. Also capable of imaging ultrathin biological tissue sections. It operates at 200kV. The 2100 Cryo is equipped with a combined video rate/slow scan camera for real time imaging and final image recording. It has a low-dose mode. A high tilt is available with +/-70 degrees using a special tip for the single tilt holder. Cryo transfer stage, double tilt heating, and liquid N2 stages are available.

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Hitachi H-9500 Dynamic Environmental TEM
  • Changqiang Chen cqchen
  • Wacek Swiech wswiech
B62A MRL

The H-9500 is a high resolution 100-300 kV ETEM with a LaB6 electron gun equipped for study of dynamic material reactions down to the atomic scale.

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JEOL JEM-1400 TEM
  • Kristen M Flatt flatt1
  • Jade Wang zyw
0021 Supercon

The JEM-1400 uses a LaB6 filament electron gun with acceleration up to 120 kV and is also capable of lowering it down to 40 kV if required (in order to minimize sample radiation where necessary). The tool is capable of a point-to-point resolution down to 0.38 nm and lattice imaging down to 0.2 nm.

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