Advanced Materials Characterization Workshop 2017

Was held onTuesday & Wednesday, June 6 & 7, 2017

At the Frederick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign

The workshop provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Presentations coveedr basic and advanced topics geared towards both novice and experienced scientists.

The focus was on problem-solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields were demonstrated.

Topics included

  • Atomic force microscopy (AFM) and nano-indentation
  • Scanning and transmission electron microscopy (SEM, TEM, STEM)
  • Focused ion beam (FIB) for sample preparation and nanofabrication
  • Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning)
  • Surface analysis: x-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS), Rutherford backscattering (RBS), Auger electron spectroscopy
  • X-ray diffraction (XRD), small-angle x-ray scattering (SAXS), glancing incidence XRD and reflectivity (XRR)
  • Special presentation on sample preparation and analysis of biological materials

Presenters

  • MRL staff scientists with 20+ years of hands-on experience in materials characterization
  • Industrial scientists introducing new technology and metrology

Special events

  • Vendors' exhibit show with live instrument demos and on-site industrial scientists discussing new applications and providing expert answers to your questions.
  • Several networking events including evening reception, breaks and lunches.

Registration is now closed.

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last updated 07 June 2017