SIMS, RBS, and a Lot of Knowledge in One Spot: Senior Research Scientist Tim Spila Shares About AMC
Senior Research Scientist Tim Spila came to the University of Illinois in the fall of 1992 as a graduate student in Materials Science and Engineering. Since then, he’s been passionate about helping others learn about techniques to help with their research. The 2018 Advanced Materials Characterization (AMC) Workshop is coming up on June 5thand 6th, so we caught up with Tim on what attendees can expect in his tutorials and the conference, generally.
Tim Spila shares:
“When I came to U of I, my Ph.D. thesis involved the growth and characterization of SiGe thin films on Si substrates by multiple techniques to study the roughening behavior due to epitaxial strain. I have been a member of the MRL research facilities since 2003, and have been presenting secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS) since the beginning.
I think AMC presentations are a great opportunity to learn about many different techniques may give ideas on better ways to do your research. AMC is a great place to get a lot of knowledge in one spot… the knowledge you get here could be the key to figuring out what technique you’ll use in the future.”
Register today to attend AMC at amc.mrl.illinois.edu.