6/6/2017
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Frederick Seitz Materials Research Laboratory (MRL) is hosting the Advanced Materials Characterization(AMC) Workshop on June 6th and 7th: a two-day workshop dedicated to providing critical, comparative, and condensed overviews of techniques for materials characterization with emphasis on practical applications. Presentations will cover a range of basic to advanced topics suited for everyone from novice to experienced scientists.
A few of the many topics included in the workshop are: atomic force microscopy (AFM) and nanoindentation, scanning and transmission electron microscopy (SEM, TEM, STEM), and focused ion beam (FIB) for sample preparation and nanofabrication. Presenters are current industrial scientists and MRL staff scientists who have twenty or more years of hands-on experience in materials characterization.
“We look forward to the AMC every year,” Mauro Sardela, MRL Facilities Director, said. “MRL is a great place for scientists to research, but also for us to share our own expertise and knowledge with one another. This year, we’re even doing a simulcast with Oklahoma State University, which should be exciting.”
The workshop includes a vendors’ exhibit show with live instrument demonstrations as well as industrial scientists discussing new applications while providing expert answers and feedback.
“AMC has been a great success at MRL in the past,” said MRL Director Paul Braun. “There are considerable opportunities for young scientists to learn about what others in their field are doing.”
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