Microscopy

Zeiss Jenavert upright and inverted microscopes
Zeiss Jenavert upright and inverted microscopes

Conventional

  • Bright-field, dark-field, circular DIC, and T-DIC
  • Reflection and transmission modes
  • High resolution image capture done with color and monochromatic CCD cameras
  • Instruments: Inverted and upright Zeiss aus Jena; inverted Zeiss Axiovert 

Confocal Raman

  • Confocal Raman microscopy with excitation at 532 nm or 785 nm
  • Line scan mode for fast Raman image acquisition
  • 300 nm lateral resolution. 500 nm vertical resolution
  • Instrument: Nanophoton Raman 11 

AFM, nano-FTIR, sSNOM

  • Chemical information from FTIR near-field reflection spectroscopy/imaging and topographic characterization with 20 nm spatial resolution
  • Instrument: neaspec nanoFTIR/NIM
  • Spatial range: 100 × 100 µm2
  • Spatial resolution: 20 nm (lateral)

WITec alpha
WITec alpha

Near-field scanning (NSOM)

  • Light transmission and topographic characterization with 100 nm spatial resolution
  • Instrument: WITec alpha
  • Spatial range: 100 × 100 µm2
  • Spatial resolution: 100 nm (lateral)