Ellipsometry

Gaertner L116C
Gaertner L116C

Single wavelength, multiple angle

  • Fixed wavelength variable angle Stokes ellipsometer
  • Measures index of refraction and thickness of a thin film or bulk materials
  • Instrument: Gaertner L116C
  • 632.8 nm

 

 

 

 

J.A. Woollam VASE
J.A. Woollam VASE

Spectroscopic

  • Spectroscopic Ellipsometry
  • Measure optical constants and thickness of multilayers or bulk materials, as well as reflectance and transmission as a function of angle of incidence, polarization, and wavelength.
  • Instrument: J.A. Woollam VASE
  • Wavelength range: 240 nm to 1700 nm;
  • Angle of incidence: 12° to 90°;
  • Temperature: 10 K to 700 K

Instructions and manuals

Tutorials