Surface Analysis 2013 Call for Papers

The 35th Annual Symposium on Applied Surface Analysis

The conference will provide a forum for scientists in all disciplines to discuss advances in surface analysis techniques and their application to thin films, semiconductors, composites, ceramics, polymers, biomaterials, catalysts, tribology, adhesion, and other material systems. Topics of particular interest include energy materials, graphene, metamaterials, thin films, and applications of quantitative surface analysis. Attention will be given to these topics as they apply to techniques such as spectroscopic ellipsometry, Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering spectroscopy, scanning probe microscopy, as well as to emerging techniques.

Contributed papers are requested for oral presentations and poster sessions. Please state your preference. The program committee will organize papers into appropriate technical sessions. Sessions will be held on June 5th, 6th, and 7th. Abstracts of no more than one letter size (8 ½ x 11) page, at least 10 pt. font, should be sent electronically to

For more information, contact Rick Haasch ( or Julio Soares (

MAY 10, 2013