AMC 2012 Program Schedule

June 6, 2012

7:45-8:30 a.m. Check in, badge pickup ESB 190 lobby
8:30-8:35 a.m. Welcome and General Information
M. Sardela
ESB 190
8:35-8:45 a.m. MRL Facilities Overview
W. Wilson, FS-MRL Facilities Director
ESB 190
8:45-9:50 a.m. Tutorial 1: Optical Characterization Methods
J. Soares, FS-MRL, University of Illinois
chair: Sardela
ESB 190
9:50-10:10 a.m. "Technical Requirements For Successful Tip Enhanced Raman (TERS) Imaging: Towards Label-Free Chemical Imaging At The Nano-scale"
E. Leroy, Horiba Scientific
chair: Sardela
ESB 190
10:10-10:40 a.m. Coffee Break ESB 190
10:40-11:45 a.m. Tutorial 2: Atomic Force Microscopy
S. MacLaren, FS-MRL, University of Illinois
chair: Spila
ESB 190
11:45 a.m.-12:05 p.m. "AM-FM and Loss Tangent Imaging: Two Tools for Quantitative Nanomechanical Property Mapping"
I. Revenko, Asylum Research
chair: Spila
ESB 190
12:05-12:45 p.m. Lunch MRL 202
12:45-1:45 p.m. Lab Tours Vendor show area
2-2:20 p.m. "Advanced AFM-Raman Setup: Towards The Spatial and Spectroscopic Resolution At Single Molecule Level"
A. Temiryazev, Russian Academy of Sciences and AIST-NT, Inc.
chair: Swiech
ESB 190
2:20-3:25 p.m. Tutorial 3: X-Ray Electron Spectroscopy/Auger Electron Spectroscopy
R. Haasch, FS-MRL, University of Illinois
chair: Swiech
ESB 190
3:25-3:50 p.m. Coffee Break Vendor show area
3:50-4:55 p.m. Tutorial 4: X-Ray Diffraction and Reflectometry
M. Sardela, FS-MRL, University of Illinois
chair: Sammann
ESB 190
4:55-5:25 p.m. "Recent Developments In A Novel Dynamical Testing Technique For Advanced Nanoscale Mechanical Properties"
J. Scirer, Hysitron, Inc.
chair: Sammann
ESB 190
5:25-6:30 p.m. Reception Vendor show area

 

June 7, 2012

8:45-9:50 a.m. Tutorial 5: Secondary Ion Mass Spectrometry/Rutherford Backscattering
T. Spila, FS-MRL, University of Illinois
chair: Wilson
ESB 190
9:50-10:10 a.m. "Nano-Impact For Investigation Of Low Cycle Fatigue For Optimization Of Cutting Tool Coating At Ambient and Elevated Temperatures"
M. Davies, Micro Materials, Ltd.
chair: Wilson
ESB 190
10:10-10:45 a.m. Coffee Break Vendor show area
10:45-11:50 a.m. Tutorial 6: A Cross-Section Of Biological and Electron Microscopy
L.A. Miller, FS-MRL, University of Illinois
chair: Soares
ESB 190
11:50 a.m.-12:10 p.m. "Nanofabrication of Plasmonic Devices in the Helium Ion Microscope"
L. Scipioni, Carl Zeiss Microscopy
chair: Soares
ESB 190
12:10-1 p.m. Lunch MRL 202
1-2:05 p.m. Tutorial 7: Scanning Electron Microscopy/Focused Ion Beam
W. Swiech, FS-MRL, University of Illinois
chair: Mabon
ESB 190
2:05-2:25 p.m. "The Schmidt-Czerny-Turner Spectrograph"
J. McClure, Princeton Instruments
chair: Mabon
ESB 190
2:25-2:55 p.m. Coffee Break ESB 190
2:55-4 p.m. Tutorial 8: Transmission Electron Microscopy
A. Shah, FS-MRL, University of Illinois
chair: Wilson
ESB 190
4 p.m. Closing
W. Wilson, FS-MRL Facilities Directory
ESB 190

Vendors show area open June 6 from 9 a.m.-6:30 p.m., and June 7 from 9 a.m.-3 p.m. at the MRL/ESB interpass

 

Platinum sponsors

AIST-NT, Asylum Research, Carl Zeiss, Horiba, Hysitron, Micro Materials, Princeton Instruments

Sponsors

AFMWorkshop, Agilent, Angstrom Scientific, American Vacuum Society, Bruker-AXS, CAMECA, Chemplex, FEI, JEOL, Kratos, Kurt J. Lesker, Oerlikon, Olympus, Ophir-Spiricon, Oxford Instruments, Rigaku, Thermo Fisher, WITec.