Advanced Materials Characterization Workshop 2016

Tuesday & Wednesday, June 7 & 8, 2016

At the Frederick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign

The workshop provides a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Presentations will cover basic and advanced topics geared towards both novice and experienced scientists.

The focus will be on problem-solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields will be demonstrated.

Topics include

  • Atomic force microscopy (AFM) and nano-indentation
  • Scanning and transmission electron microscopy (SEM, TEM, STEM)
  • Focused ion beam (FIB) for sample preparation and nanofabrication
  • Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning)
  • Surface analysis: x-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS), Rutherford backscattering (RBS), Auger electron spectroscopy
  • X-ray diffraction (XRD), small-angle x-ray scattering (SAXS), glancing incidence XRD and reflectivity (XRR)
  • Special presentation on sample preparation and analysis of biological materials


  • MRL staff scientists with 20+ years of hands-on experience in materials characterization
  • Industrial scientists introducing new technology and metrology

Special events

  • Vendors' exhibit show with live instrument demos and on-site industrial scientists discussing new applications and providing expert answers to your questions.
  • Several networking events including evening reception, breaks and lunches.


Only $75 for both days including all lectures, boxed lunches, coffee breaks, evening reception and full access to the vendors show and instrument demos.




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