Advanced Materials Characterization Workshop 2015 Presentations

Downloadable PDF Versions of AMC2015 Presentations

Transmission Electron Microscopy
Wacek Swiech, CQ Chen, Jim Mabon, Honghui Zhou and Matt Bresin, MRL

Introduction to Elemental Analysis by ED-XRF
Justin Masone, Shimadzu

Nano- and Micromechanics
Kathy Walsh, MRL

Optical Materials Characterization
Julio Soares, MRL

Rutherford Backscattering Spectrometry
Timothy P. Spila, MRL

Secondary Ion Mass Spectrometry
Timothy P. Spila, MRL

X-Ray Analysis Methods
Mauro Sardela

Quantitative Elastic Measurements of High Modulus Materials with Tapping/AM-FM Mode
Ted Limpoco, Marta Kocum, Waiman Meinhold, Aleks Labuda and Roger Proksch, Asylum Research

IR Imaging and Spectroscopy at 10nm Spatial Resolution
Tobias Gokus, NeaSpec

Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer
Scott Speakman, Panalytical