Advanced Materials Characterization Workshop 2014

Was held at the Materials Research Laboratory
University of Illinois at Urbana-Champaign

Tuesday & Wednesday
June 3-4, 2014

This workshop provides a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures will cover basic and advanced topics geared towards both novice and experienced scientists.

Focus on problem-solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields will be demonstrated.

Topics include:

  • Atomic force microscopy (AFM).
  • Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning).
  • Surface analysis: Auger electron spectroscopy, secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS).
  • Scanning and transmission electron microscopy (SEM, TEM, STEM).
  • X-ray diffraction (XRD), reflectivity (XRR), micro-XRD and small angle x-ray scatterings (SAXS)
  • Special session on sample preparation and analysis of biological materials.


  • MRL staff scientists with 20+ years of hands-on experience in materials characterization.
  • Industrial scientists introducing new technology and metrology.

Special events:

  • Vendors exhibit show with live instrument demos and on-site industrial scientists discussing new applications and providing expert answers to your questions.
  • Several networking events including evening reception, breaks and lunches.

Program PDF

Registration is closed:

Only $70 for both days including all lectures, breakfast and coffee breaks, boxed lunches, evening reception Tuesday and full access to vendors show and instrument demos. Space is limited!