Advanced Materials Characterization Workshop 2013 - Presentations

 

Downloadable PDF Versions of AMC2013 Presentations

Rutherford Backscattering & Secondary Ion Mass Spectrometery: Timothy P. Spila, Ph.D.

X-ray Analysis Methods: Mauro Sardela, Ph.D.

Scanning Electron Microscopy (SEM) and Focused Ion Beams (FIB) in Materials Research: Jim Mabon, Wacek Swiech, Honghui Zhou and Catalin Chiritescu

Transmission Electron Microscopy: Wacek Swiech, Honghui Zhou, Jim Mabon, Amish Shah and Jian-Guo Wen

 

Advanced Materials Characterization Workshop 2013