2013 Workshop Program

Advanced Materials Characterization Workshop 2013

Fredercick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign

MONDAY, JUNE 3 

All presentations in Room 190
Engineering Sciences Building Auditorium

 8:00       Check in (MRL Main Hallway)

 8:40       Welcome 
              M. Sardela (FS-MRL University of Illinois)

 8:45       MRL Facilities Overview
              W. Wilson, FS-MRL Facilities Director

 9:00       Tutorial 1:
              Rutherford Backscattering /
              Secondary Ion Mass Spectrometry

              T. Spila, FS-MRL, University of Illinois

10:05      Coffee Break (MRL Main Hallway)

10:35      Tutorial 2:
              Optical Characterization Methods

              J. Soares, FS-MRL, University of Illinois

11:40      Detectors for Spectroscopy Applications
              J. McClure, Princeton Instruments

12:00      Lunch (Room 201 MRL)

12:45      Lab Tours 

 2:00       Tutorial 3:
              Scanning Electron Microscopy/Focused Ion Beam

              W. Swiech, FS-MRL, University of Illinois

 3:05       Coffee Break (FSMRL Main Hallway)

 3:35       Tutorial 4:
              X-ray Diffraction and Reflectometry
              M. Sardela, FS-MRL, University of Illinois

 4:40       Nanostructured Materials Characterization
              by Small Angle X-Ray Scattering (SAXS)

              S. Rekhi, PANalytical, Inc.

 5:00       Reception (MRL Main Hallway)


TUESDAY, JUNE 4

 9:00       Tutorial 5:
              A Cross-section of Biological and Electron Microscopy
              L.A. Miller, FS-MRL, University of Illinois

10:05      Coffee Break (FSMRL Main Hallway)

10:35      Tutorial 6:
              Atomic Force Microscopy

              S. MacLaren, FS-MRL, University of Illinois

11:40      Beyond Topography:
              An Overview of AFM Nanomechanical Techniques

              M. Reitsma, Asylum Research & Oxford Instruments

12:00      Lunch (Room 201 FSMRL)

 1:00       Tutorial 7:
              X-ray Electron Spectroscopy / Auger Electron Spectroscopy

              R. Haasch, FS-MRL, University of Illinois

 2:05       In Situ Nanomechanics inside SEM and TEM
               D. Stauffer, Hysitron

 2:25       Coffee Break (FSMRL Main Hallway)

 2:55       Tutorial 8:
              Transmission Electron Microscopy

              W. Swiech and H. Zhou, FS-MRL, University of Illinois

4:00        Closing Remarks
              W. Wilson, FS-MRL Facilities Director

PROGRAM PDF (ONE PAGE)
 

 

Advanced Materials Characterization Workshop 2013