Advanced Materials Characterization Workshop 2016 Presentations

Downloadable PDF Versions of AMC2016 Presentations

X-ray Analysis Methods
Mauro Sardela, Ph.D., FS-MRL, UIUC

Rutherford Backscattering Spectrometry
Timothy P. Spila, Ph,D., FS-MRL, UIUC

Secondary Ion Mass Spectrosmetry
Timothy P. Spila, Ph,D., FS-MRL, UIUC

Nanoindentation
Kathy Walsh, Ph.D., FS-MRL, UIUC

Transition Mode Reactive Sputtering by Plasma Emission Monitor Control
Craig Outten, Ph.D., Denton Vacuum

In-situ Study of Lithium Battery with Electrochemistry/AFM
Song Xu, Ph.D., Sr. Application Scientist, Keysight Technologies

ED-XRF: Principles and Applications
Justin Masone, Shimadzu Scientific Instruments

Cryogen Free Scanning Probe Microscope: The Solution for Atomic Scale Surface Science Below 10 Kelvin without Liquid Helium
Byong Choi, Miquel Venegas, and Craig Wall, RHK Technologies, USA

3D Printing and Beyond: Desktop Manufacture and its Application in Scientific Research
Song Xu, Ph.D., Sr. Application Scientist, Keysight Technologies

Bringing Hard Radiation Back to the Lab
Scott Speakman, Panalytical