Advanced Materials Characterization Workshop 2014 - Presentations

Downloadable PDF Versions of AMC2014 Presentations

Optical Materials Characterization
Julio Soares

Rutherford Backscattering Spectrometry
Timothy P. Spila, Ph.D.

Secondary Ion Mass Spectrometry
Timothy P. Spila, Ph.D.

Nano- and Micromechanics
Kathy Walsh, Ph.D.

X-ray Analysis Methods
Mauro Sardela, Ph.D.

Scanning Electron Microscopy (SEM) and
Focused Ion Beams (FIB) in Materials Research

Jim Mabon, Wacek Swiech, Honghui Zhou, Matt Bresin and Catalin Chiritescu

Transmission Electron Microscopy
Wacek Swiech, Honghui Zhou, Jim Mabon, Changqiang (CQ) Chen and Matt Bresin