2014 Workshop Program

Advanced Materials Characterization Workshop 2014

Frederick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign

TUESDAY, JUNE 3 

All presentations in Room 190
Engineering Sciences Building Auditorium

 8:15       Check in (FS-MRL Main Hallway)

 8:40       Welcome 
               M. Sardela (FS-MRL University of Illinois)

 8:45       MRL Facilities Overview
               W. Wilson, FS-MRL Research Facilities Director

 9:00       Tutorial 1:
               Optical Characterization Methods
               J. Soares, FS-MRL, University of Illinois

10:05      Coffee Break (FS-MRL Main Hallway)

10:35      Tutorial 2:
               Scanning Electron Microscopy/
               Focused Ion Beam

               W. Swiech, FS-MRL, University of Illinois

11:40      Improved Hyperspectral Imaging With
               a Schmidt-Czerny-Turner Spectrograph

               J. McClure, Princeton Instruments

12:00      Lunch (Room 201 FS-MRL)

12:45      Lab Tours (meet at vendors exhibit area)

 2:00       Introducing Nan-FTIR-imaging and Spectroscopy
               at 10nm Spatial Resolution

               T. Gokus, Neaspec

 2:20       Tutorial 3:
               A Cross-section of Biological and Electron Microscopy

               L.A. Miller, FS-MRL, University of Illinois

 3:00       Coffee Break (FS-MRL Main Hallway)

 3:35       Tutorial 4:
               Rutherford Backscattering
               T. Spila, FS-MRL, University of Illinois

 3:50       Tutorial 5:
               X-ray Analysis Methods

               M. Sardela, FS-MRL, University of Illinois

 5:00       Reception (FS-MRL Main Hallway)


WEDNESDAY, JUNE 4

 9:00       Tutorial 6:
               X-ray Electron Spectroscopy/
               Auger Electron Spectroscopy (part 1)

               R. Haasch, FS-MRL, University of Illinois

 9:30       Tutorial 7:
               Nano and Micromechanics

               K. Walsh, FS-MRL, University of Illinois

10:00      Coffee Break (FS-MRL Main Hallway)

10:30      Tutorial 8:
               Atomic Force Microscopy

               S. MacLaren, FS-MRL, University of Illinois

11:35      blueDriveTM Photothermal Excitation for Fast,
               Reliable and Quantitative AFM
               M. Reitsma, Asylum Research & Oxford Instruments

11:55      Lunch (Room 201 FS-MRL)

 1:00       AFM-IR: Nanoscale IR Spectrocopy for the
               Materials and Life Sciences

               D. Voci, Anasys Instruments

 1:20       Tutorial 9:
               Secondary Ion Mass Spectrometry
               T. Spila, FS-MRL, University of Illinois

 2:00       Tutorial 10:
               X-ray Electron Spectroscopy/
               Auger Electron Spectroscopy (part 2)

               R. Haasch, FS-MRL, University of Illinois

 2:35       Coffee Break (FSMRL Main Hallway)

 3:00       Tutorial 11:
               Transmission Electron Microscopy

               W. Swiech and H. Zhou, FS-MRL, University of Illinois

4:00        Closing Remarks
               W. Wilson, FS-MRL Research Facilities Director

Program PDF