Ellipsometry

Used for determining index of refraction and thickness of thin films and multilayer structures.

Gaertner L116C
Gaertner L116C

Single wavelength, multiple angle

  • Fixed wavelength variable angle Stokes ellipsometer
  • Measures index of refraction and thickness of a thin film
  • Instrument: Gaertner L116C
  • 632.8 nm currently available

Instructions and manuals

Tutorials

 

J.A. Woollam VASE
J.A. Woollam VASE

Spectroscopic

  • Spectroscopic Ellipsometry
  • Measure index of refraction, absorption, and thickness of multilayers
  • Instrument: J.A. Woollam VASE
  • Wavelength range: 240 nm to 1700 nm; Angle of incidence: 12 degres to 90 degrees; Temperature: 10 Kelvin to 700 Kelvin

Instructions and manuals

Tutorials