JEOL 2200 FS (S)TEM

Equipment Location: 
B70C MRL

The aberration-corrected JEM-2200FS, a state-of-the-art analytical electron microscope, is equipped with a 200kV field emission gun (FEG), a CEOS probe Cs-corrector, and an in-column energy filter (Omega Filter) that allows elemental analysis and chemical analysis of specimens. It is also equipped with an Energy Dispersive X-ray Spectrometer (EDS) and a CCD-camera. With an available small probe size of ~0.1 nm, atomic level high-resolution high-angle annular dark-field (Z-contrast) images, and high resolution EELS spectrum imaging can be obtained. With the low background Be specimen holder, large (50mm2) detector area, and the hard X-ray aperture, high-quality EDS analysis and mapping is available.

Specifications:

  • Cs = 0.5mm Cc = 1.1mm
  • Energy 200kV
  • Tilt 25 degrees on both axes
  • HAADF Resolution = 0.1nm
  • HREM Point resolution = 0.19nm
  • Information Limit better than 0.1nm
  • Sample loading-Side entry
  • Energy Spread better than 0.8eV

Attachments:

  • Corrector - CEOS Cs-corrector system
  • Image Filter - In-column Omega Filter
  • EDS - Oxford INCA 50mm2 detector
  • Digital Imaging - 2k Gatan CCD
  • Digital Scan - Gatan Digiscan
  • Video - Hamamatsu cameras
  • HAADF Detector
  • BF Detector
  • Low-background double tilt holder