CMM Staff

CMM houses a suite of state-of-the-art instrumentation focussing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, X-ray, and laser techniques. CMM operates under the guidelines of the MRL Central Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.

CMM offers:

General Numbers

William Wilson
Director of Facilities
P: (217) 244-5083
F: (217) 244-2278

Administrative secretary: Chris Johns  (217) 333-1371

Accelerator Techniques: (217) 333-1383
Electron Microscopy: (217) 333-3888
Surface Analysis: (217) 333-0386
X-Ray Diffraction: (217) 333-1612

Staff Directory:

Accelerator-based Techniques for Analysis

Doug Jeffers
B70 MRL
(217) 333-1383

Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)

Jim Mabon
372/0020 MRL
(217) 333-4265

Scanning Probe Microscopy (SPM)

Scott MacLaren
368/0014 MRL
(217) 244-2969

Surface Analysis

Steve Burdin
301/0016 MRL
(217) 244-2973

Rick Haasch
302/B81/B06/B08 MRL
(217) 244-2967

Tim Spila
308/B01/B04 MRL
(217) 244-0298

Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM)

Jim Mabon
372/0020 MRL
(217) 333-4265

Wacek Swiech
306 MRL
(217) 244-9499

X-ray Diffraction and Reflectivity (XRD) and (XRR)

Mauro Sardela
370/148 MRL
(217) 244-0547