CMM Staff

CMM houses a suite of state-of-the-art instrumentation focusing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, X-ray, and laser techniques. CMM operates under the guidelines of the MRL Central Research Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.

CMM offers:

General Numbers

William Wilson
Director of Facilities
P: (217) 244-5083
F: (217) 244-2278

Office Administrator: Chris Johns  (217) 333-1371

Accelerator Techniques: (217) 333-1383
Electron Microscopy: (217) 333-3888
Surface Analysis: (217) 333-0386
X-Ray Diffraction: (217) 333-1612

Staff Directory:

Accelerator-based Techniques for Analysis

Doug Jeffers
304 MRL

Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)

Jim Mabon
372 MRL

Honghui Zhou
256 MRL

Matt Bresin
256 MRL

Scanning Probe Microscopy (SPM)

Scott MacLaren
368/0014 MRL

Kathy Walsh
256 MRL

Surface Analysis

Steve Burdin
301/0016 MRL

Rick Haasch
302/B81/B06/B08 MRL

Tim Spila
308/B01/B04 MRL

Kathy Walsh
256 MRL

Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM)

Jim Mabon
372/0020 MRL

Wacek Swiech
306 MRL

X-ray Diffraction and Reflectivity (XRD) and (XRR)

Mauro Sardela
370/148 MRL
(217) 244-0547