CMM Staff

CMM houses a suite of state-of-the-art instrumentation focusing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, X-ray, and laser techniques. CMM operates under the guidelines of the MRL Central Research Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.

CMM offers:

General Numbers

Dr. Mauro Sardela
Director of Central Research Facilities
2014 Supercon
P: (217) 244-0547
F: (217) 244-2278

Chris Johns
Office Administrator
(217) 333-1371

Staff Directory:

Accelerator-based Techniques for Analysis

Doug Jeffers
304 MRL

Brad Stumphy

Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)

Jim Mabon
372 MRL

Honghui Zhou
404 MRL

Elvan Ekiz-Stumphy
256 MRL

Scanning Probe Microscopy (SPM)

Scott MacLaren
368/0014 MRL

Kathy Walsh
406 MRL

Surface Analysis

Steve Burdin
301/0016 MRL

Rick Haasch
302/B81/B06/B08 MRL

Tim Spila
308/B01/B04 MRL

Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM)

CQ Chen
402 MRL

Jim Mabon
372/0020 MRL

Lou Ann Miller
374 MRL

Wacek Swiech
306 MRL

Honghui Zhou
404 MRL

X-ray Diffraction and Reflectivity (XRD) and (XRR)

Mauro Sardela
370/148 MRL/2014 Supercon

Natalie Becerra-Stasiewicz
256 MRL

Elvan Ekiz-Stumphy
256 MRL