CMM Staff

CMM houses a suite of state-of-the-art instrumentation focussing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, X-ray, and laser techniques. CMM operates under the guidelines of the MRL Central Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.

CMM offers:

General Numbers

William Wilson
Director of Facilities
P: (217) 244-5083
F: (217) 244-2278

Administrative secretary: Chris Johns (217) 333-1371

Accelerator Techniques: (217) 333-1383
Electron Microscopy: (217) 333-3888
Surface Analysis: (217) 333-0386
X-Ray Diffraction: (217) 333-1612