Surface Analysis 2013

The 35th Annual Symposium
on Applied Surface Analysis

Was held on June 5-7, 2013

The Frederick Seitz Materials Research Laboratory at the University of Illinois, together with the Prairie Chapter of AVS and the University of Illinois at Urbana-Champaign Student Chapter of AVS, will host Surface Analysis 2013, the 35th Symposium on Applied Surface Analysis. This year’s meeting will be held together in the same week with the 7th Advanced Materials Characterization Workshop.

The conference will provide a forum for scientists in all disciplines to discuss advances in surface analysis techniques and their application to thin films, semiconductors, composites, ceramics, polymers, biomaterials, catalysts, tribology, adhesion, and other material systems. Topics of particular interest include energy materials, graphene, metamaterials, thin films, and applications of quantitative surface analysis. Attention will be given to these topics as they apply to techniques such as spectroscopic ellipsometry, Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering spectroscopy, scanning probe microscopy, as well as to emerging techniques.

Plenary talks will be presented by nationally and internationally renowned speakers representing the diverse interdisciplinary nature of the AVS Applied Surface Science Division and the Materials Research Laboratory. Invited speakers include:

     Anna Belu, Medtronic Corporation
     Industrial Applications of SIMS

     Jessica McChesney, Argonne National Laboratory
     Synchrotron-based Photoelectron Spectroscopy
 
     Richard Matyi, SUNY Albany
     X-ray Reflectometry for Surface- and Near-surface Analysis

     Angus Rockett, University of Illinois at Urbana-Champaign
     Photovoltaics

     Michael Trenary, University of Illinois at Chicago
     Surface Structure and Chemistry

     Frank Urban, Florida International University
     Spectroscopic Ellipsometry

     Hua Chun Zeng, National University of Singapore
     Synthesis and Surface Characterization of Catalytic Nanomaterials

CALL FOR PAPERS (pdf announcement)
The deadline has been extended to May 10, 2013

SURFACE ANALYSIS 2013 CONFERENCE FLYER