Gatan Nanofactory Workshop

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As part of its outreach activities, the Center for Microanalysis of Materials and Frederick Seitz Materials Research Laboratory has hosted and will continue to host, a variety of National/Regional conferences with topics of interest to the materials research community. Past conferences have had a strong emphasisis on the characterization of materials at the nanoscale.

Gatan Nanofactory Workshop

Nov 14-15, 2005

Nanofactory and Gatan Inc. held a workshop to discuss and demonstrate the unique SPM-TEM holders which are available. STM-TEM and TEM-Nanoindentor systems were presented for in-situ microscopy and analysis of nanostructures. These systems allow acquisition of data regarding the structural, electronic, mechanical and refractive properties of individual nanostructures in the same experiment. Specifically the conductivity, elastic constants and the mechanical strength can be measured with these systems for individual nanostructures. If combined with simultaneous HRTEM imaging and EELS analysis, a full in-situ nano-characterization is possible. This workshop focused on the introduction of SPM-TEM technique for the nano-materials and the demonstration of data acquisition in the TEM. It covered basics of the SPM microscopy such as STM, nanoindentation and in-situ AFM. Simultaneous combination of SPM and TEM microscopy in one experiment will become a routine approach for the future in-situ nanocharacterization.