Fluctuation Microscopy Conference

Conference attendees watching presentation

As part of its outreach activities, the Center for Microanalysis of Materials and Frederick Seitz Materials Research Laboratory has hosted and will continue to host, a variety of National/Regional conferences with topics of interest to the materials research community. Past conferences have had a strong emphasisis on the characterization of materials at the nanoscale.

Fluctuation Electron Microscopy and Nanoscale Ordering in Amorphous Materials

June 23-24, 2003

The advent of fluctuation electron microscopy (FEM) in 1996 has opened up new possibilities for understanding nanoscale (medium range) ordering in amorphous materials, including semiconductors, metallic glasses, oxides, and soft materials. This 2-day workshop intended to bring together researchers who are engaged in various aspects of the nanoscale ordering problem, including the (i) development of scattering experiments and analytical methods; (ii) theory and models of amorphous structures; (iii) experimental results including solid state properties; and (iv) future directions. The workshop featured a single session with invited talks, contributed talks, posters, and ample time for discussion.

This workshop was hosted by the Center for Microanalysis of Materials in the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, which is the location of a NSF-FRG program on the FEM technique and nanoscale ordering.