Advanced Materials Characterization Workshop 2013
Held at the Materials Research Laboratory
University of Illinois at Urbana-Champaign
June 3-4, 2013
This workshop provides a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications.
- Atomic force microscopy (AFM)
- Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning)
- Surface analysis: Auger electron spectroscopy, secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS).
- Scanning and transmission electron microscopy (SEM, TEM, STEM).
- X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including micro-XRD.
- Special session on sample preparation and analysis of biological materials.
- MRL staff scientists with 20+ years of hands-on experience in their fields.
- Industrial scientists introducing new technology and metrology.
- Focus on problem solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields.
- Vendors exhibit show with live instrument demos and on-site industrial scientists discussing new applications and providing expert answers to your questions.
- Several networking events including evening reception, breaks and lunches.
- MRL facilities tours.The workshop will be immediately followed by the AVS Surface Analysis Conference hosted also in the MRL from June 5 to 7.