Advanced AFM Workshop 2012
Advanced AFM Workshop
March 21-22, 2012 9am-4:45pm
Hosted by Asylum Research and the Frederick Seitz Materials Research Laboratory, University of Illinois.
Asylum Research and the Frederick Seitz Materials Research Laboratory at the University of Illinois Urbana Champaign (Illinois), announce the "Advanced AFM Workshop" on March 21-22, 2012. The workshop will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM), PFM, multifrequency techniques, new scanning techniques for nanomechanical characterization, and a tutorial on IGOR Pro software. Illinois researchers will also present current research on piezoresponse force microscopy (PFM), quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to Illinois personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM scanning techniques.
Register now, space is limited. (All attendees must be registered)
Registration fee: $40 per person; includes full access to lectures and demonstrations, lunches, and refreshments during breaks.
Julie ten Have: email@example.com
Materials Research Laboratory
104 South Goodwin Avenue - MC230
Urbana, IL 61801
fax (217) 244-2278
phone (217) 333-1381
Presented and sponsored by: